Publicado

2018-04-01

Discrimination between the lognormal and Weibull Distributions by using multiple linear regression

Discriminación entre la distribución lognormal y la distribución Weibull utilizando regresión lineal múltiple

Palabras clave:

Weibull distribution, lognormal distribution, discrimination process, multiple linear regression, Gumbel distribution (en)
distribución Weibull, distribución lognormal, proceso de discriminación, regresión lineal múltiple, distribución Gumbel (es)

Autores/as

In reliability analysis, both the Weibull and the lognormal distributions are analyzed by using the observed data logarithms. While the Weibull data logarithm presents skewness, the lognormal data logarithm is symmetrical. This paper presents a method to discriminate between both distributions based on: 1) the coefficients of variation (CV), 2) the standard deviation of the data logarithms, 3) the percentile position of the mean of the data logarithm and 4) the cumulated logarithm dispersion before and after the mean. The efficiency of the proposed method is based on the fact that the ratio of the lognormal (b1ln) and Weibull (b1w) regression coefficients (slopes) b1ln/b1w efficiently represents the skew behavior. Thus, since the ratio of the lognormal (Rln) and Weibull (Rw) correlation coefficients Rln/Rw (for a fixed sample size) depends only on the b1ln/b1w ratio, then the multiple correlation coefficient R2 is used as the index to discriminate between both distributions. An application and the impact that a wrong selection has on R(t) are given also.
En el análisis de confiabilidad, las distribuciones Weibull y lognormal son ambas analizadas utilizando el logaritmo de los datos observados. Debido a que mientras el logaritmo de datos Weibull presenta sesgo, el logaritmo de datos lognormales es simétrico, entonces en este artículo basados en 1) los coeficientes de variación (CV), 2) en la desviación estándar del logaritmo de los datos, 3) en la posición del percentil de la media del logaritmo de los datos y 4) en dispersión acumulada del logaritmo antes y después de la media, un método para discriminar entre ambas distribuciones es presentado. La eficiencia del método propuesto está basado en el hecho de que el radio entre los coeficientes de regresión (pendientes) b1ln/b1w de la distribución lognormal (b1ln) y de la distribución Weibull (b1w), eficientemente representa el comportamiento del sesgo. De esta manera, dado que el radio de los coeficientes de correlación de la distribución lognormal (Rln) y de la distribución Weibull (Rw), (para un tamaño de muestra fijo), solo depende del radio b1ln/b1w, entonces el coeficiente de correlación múltiple R2 es utilizado como un índice para discriminar entre ambas distribuciones. Una aplicación y el impacto que una mala selección tiene sobre R(t) son también dadas.

Citas

Rinne, H., The Weibull distribution, a handbook. Boca Raton, FL: CRC Press, 2008.

Marathe, R.R. and Ryan, S.M., On the validity of the geometric Brownian motion assumption. The Engineering Economist, 50(2), pp. 159-192, 2005. DOI: /10.1080/00137910590949904

Kececioglu, D., Robust engineering design-by-reliability with emphasis on mechanical components & structural reliability. Lancaster, PA: DEStech Publications, 2003.

Wessels, W.R., Practical reliability engineering and analysis for system design and life-cyce sustainment. Boca Raton, FL: CRC Press, 2010.

Kececioglu, D., Reliability & life testing handbook, volume 1. Lancaster, PA: DEStech Publications, 2002.

Kim, J.S. and Yum, B.J., Selection between Weibull and lognormal distributions: A comparative simulation study. Computational Statistics & Data Analysis, 53(2), pp. 477-485, 2008. DOI: 10.1016/j.csda.2008.08.012

Dey, A.K. and Kundu, D., Discriminating among the log-normal, Weibull, and generalized exponential distributions. IEEE Transactions on Reliability. 58(3), pp. 416-424, 2009. DOI: 10.1109/TR.2009.2019494

Mitosek, H.T. Strupczewski,W.G. and Singh, V.P., Three procedures for selection of annual flood peak distribution. Journal of Hydrology. 323(1–4), pp. 57-73, 2006. DOI: 10.1016/j.jhydrol.2005.08.016

Pasha, G.R. Khan, M.S. and Pasha, A.H., Discrimination between Weibull and lognormal distributions for lifetime data. Journal of Research (science) [Online]. 17(2), pp. 103-114, 2006. [date of reference March 15th of 2017]. Available at: https://www.bzu.edu.pk/jrscience/vol17no2/

Fan, J. Yung, K.C. and Pecht, M., Comparison of statistical models for the lumen lifetime distribution of high power white LEDs, Proceedings of IEEE Prognostics and Systems Health Management Conference (PHM), 2012. pp. 1-7. DOI: 10.1109/PHM.2012.6228801

Bagdonavičius, V.B. Levuliene, R.J. and Nikulin, M.S., Exact goodness-of-fit tests for shape-scale families and type II censoring. Lifetime Data Analysis. 19(3), pp. 413-435, 2013. DOI:10.1007/s10985-013-9252-x

Wilson, S.R., Leonard, R.D., Edwards, D.J., Swieringa, K.A. and Murdoch, J.L.,Model specification and confidence intervals for voice communication. Quality Engineering. 27(4), pp. 402-415, 2015. DOI: 10.1080/08982112.2015.1023313

Cain, S., Distinguishing between lognormal and Weibull distributions. IEEE Transactions on Reliability. 51(1), pp. 32-38, 2002. DOI: 10.1109/24.994903

Whitman, C. and Meeder, M., Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Microelectronics Reliability. 45(12), pp. 1882-1893, 2005. DOI: 10.1016/j.microrel.2005.01.016

Prendergast, J., O’Driscoll, E. and Mullen, E., Investigation into the correct statistical distribution for oxide breakdown over oxide thickness range. Microelectronics Reliability. 45(5–6), pp. 973-977, 2005. DOI: 10.1016/j.microrel.2004.11.013

Marshall, I., Meza, A.W. and Olkin, J.C., Can data recognize its parent distribution?. Journal of Computational and Graphical Statistics [Online]. 10(3), pp. 555-580, 2001. [dae of reference April 24th 2017]. Available at: https://www.jstor.org/stable/1391104?seq=1#page_scan_tab_contents

Yu, H.-F.. The effect of mis-specification between the lognormal and Weibull distributions on the interval estimation of a quantile for complete data. Communications in Statistics - Theory and Methods. 41(9), pp. 1617-1635, 2012. DOI: 10.1080/03610926.2010.546548

Upadhyay, S.K. and Peshwani, M., Choice between Weibull and lognormal models: a simulation based bayesian study. Communications in Statistics - Theory and Methods. 32(2), pp. 381-405, 2003. DOI: 10.1081/STA-120018191

Crowder, M.J., Kimber, A.C., Smith, R.L. and Sweeting, T.J., Statistical analysis of reliability data. CRC Press, 1994.

Genschel, U. and Meeker, W.Q., A comparison of maximum likelihood and median-rank regression for Weibull estimation. Quality Engineering. 22(4), pp. 236-255, 2010. DOI: 10.1080/08982112.2010.503447

NIST/SEMATECH. Extreme value distributions. e-Handbook of Statistical Methods [Online]. [date of reference January 9th 2017]. Available at: http://www.itl.nist.gov/div898/handbook/.

Kahle, J. and Collani, F., Advances in stochastic models for reliability, quality and safety. Boston, MA: Springer Science & Business Media, 2012.

Dodson, B., The Weibull analysis handbook. Milwaukee, WI: ASQ Quality Press, 2006.

Mischke, C.R.. A distribution-independent plotting rule for ordered failures. Journal of Mechanical Design. 104(3), pp. 5, 1982. DOI: 10.1115/1.3256391

Piña-Monarrez, M.R., Ramos-Lopez, M.L., Alvarado-Iniesta, A. and Molina-Arredondo, R.D., Robust sample size for Weibull demonstration test plan. DYNA Colombia. 83(197), pp. 52-57, 2016. DOI: 10.15446/dyna.v83n197.44917

Wessels, W.R., Practical reliability engineering and analysis for system design and life-cycle sustainment. Boca Raton, FL: CRC Press, 2010.