Published
Estudio de propiedades estructurales de películas delgadas de CdS depositadas por sublimación en espacio semicerrado
Keywords:
Temperaturas del sustrato, Evaporación, Difracción de rayos-x. (es)Downloads
En este trabajo se estudia el efecto de las temperaturas del sustrato y de evaporación, de la distancia entre el evaporador y el sustrato sobre la fase y la orientación cristalográfica de películas delgadas de CdS, preparadas por el método de sublimación en espacio semicerrado (C.S.S.) usando la técnica de difracción de rayos-x.
In this work we study the effect of substrate and evaporation temperatures and substrate-evaporator distance on the phase and crystallographic orientation of CdS thin films prepared by the C.S.S. method using the x-ray diffraction technique.
Article abstract page views
Downloads
How to Cite
License
Those authors who have publications with this journal, accept the following terms:
a. The authors will retain their copyright and will guarantee the publication of the first publication of their work, which will be subject to the Attribution-SinDerivar 4.0 International Creative Commons Attribution License that permits redistribution, commercial or non-commercial, As long as the Work circulates intact and unchanged, where it indicates its author and its first publication in this magazine.
b. Authors are encouraged to disseminate their work through the Internet (eg in institutional telematic files or on their website) before and during the sending process, which can produce interesting exchanges and increase appointments of the published work.
