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Estudio de propiedades estructurales de películas delgadas de CdS depositadas por sublimación en espacio semicerrado
Keywords:
Temperaturas del sustrato, Evaporación, Difracción de rayos-x. (es)Downloads
En este trabajo se estudia el efecto de las temperaturas del sustrato y de evaporación, de la distancia entre el evaporador y el sustrato sobre la fase y la orientación cristalográfica de películas delgadas de CdS, preparadas por el método de sublimación en espacio semicerrado (C.S.S.) usando la técnica de difracción de rayos-x.
In this work we study the effect of substrate and evaporation temperatures and substrate-evaporator distance on the phase and crystallographic orientation of CdS thin films prepared by the C.S.S. method using the x-ray diffraction technique.
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