Published

2016-07-01

SISTEMATIZACIÓN DE UN SISTEMA DE MEDICIÓN DE VOLTAJE HALL EN DEPENDENCIA DE LA TEMPERATURA, USANDO INSTRUMENTACIÓN VIRTUAL

SISTEMATIZATION OF A MEASURING SYSTEM FOR HALL VOLTAGE AS A FUNCTION OF TEMPERATURE, USING VIRTUAL INSTRUMENTATION

Keywords:

Instrumentación virtual, LabVIEW, Voltaje Hall vs T, transporte eléctrico. (es)
Virtual instrumentation, LabVIEW, Hall voltage vs T, electric transport. (en)

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Authors

  • Asdrúbal A. Ramírez Departamento de Ingeniería Química, Universidad Nacional, Bogotá
  • Johana S. Oyola Departamento de Física, Universidad Nacional de Colombia, Bogotá
  • Francisco Guzmán Departamento de Física, Universidad Nacional de Colombia, Bogotá
  • Edwin A. Ramírez Departamento de Ingeniería Mecánica y Mecatrónica, Universidad Nacional, Bogotá
  • Gerardo Gordillo Departamento de Física, Universidad Nacional de Colombia, Bogotá
Este trabajo presenta detalles del diseño e implementación de un sistema de medición de voltaje Hall en dependencia de la temperatura, desarrollado usando el concepto de Instrumentación Virtual. Para tal efecto se usó hardware de la National Instruments y el paquete LabVIEW como software. El sistema es controlado a través de un instrumento virtual (IV) que incluye facilidades para realizar control PID de temperatura de la muestra en el rango 80 K - 700 K, medición de voltaje Hall (VH) usando el método de cuatro contactos y visualización en tiempo real de la curva de VH vs T. El sistema fue probado realizando medidas de voltaje Hall vs T a películas delgadas de CuInS2 usadas como capa absorbente en celdas solares, con el propósito de obtener información de sus propiedades de transporte eléctrico.

This paper presents details of the design and implementation of a system for measuring Hall voltage in dependence of the temperature, developed using the Virtual Instrumentation concept. For that we have used National Instrument hardware and the LabVIEW package as software. The system is controlled by a virtual instrument (VI) which includes facilities to perform PID control of sample temperature in the range of 80 K -700 K, Hall voltage measurement(VH) using the method of four contacts and real time display of the VH vs T curve. The system was tested by performing Hall voltage measurements vs T on CuInS2(CIS) thin films used as the absorber layer in solar cells, for the purpose of obtaining information from its transport properties.

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