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Double Sampling Plan for OPPE Model Using Combined Mean
Plan de muestreo doble para el modelo OPPE utilizando media combinada
DOI:
https://doi.org/10.15446/rce.v47n2.108197Palabras clave:
Consumer’s Risk, Lindley Distribution, Operating Characteristics (OC) Curve, Producer’s Risk, Single Sampling Inspection Plan (en)Curva de características de operación, Distribución Lindley, Plan de inspección por muestreo único, Riesgo del Consumidor, Riesgo del productor (es)
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This work provides Double Sampling (DS) inspection plans considering the average lifetime as a quality characteristic which follows one parameter polynomial exponential (OPPE) family of distributions. Exponential, Lindley, Akash, Aradhana, Sujatha, length-biased Lindley, etc., are a few particular cases of the OPPE family. The quality of a lot is computed in this technique, by the lot average (μ) for first sample and, for the second sample we have taken combined mean to measure the lot quality. Also, we have estimated the optimum value of parameters of the proposed plan by non-linear optimization approaches considering acceptable quality level and rejectable quality level. A comparison part of the study is given, with respect to the sample size, between the Double Sampling (DS) plan and the Single Sampling (SS) plan for the variable. To describe the proposed work, we have also taken one example.
Este trabajo proporciona planos de inspección de doble muestreo (DS) considerando la vida útil promedio como una característica de calidad que sigue una familia de distribuciones polinomiales exponenciales (OPPE). Exponencial, Lindley, Akash, Aradhana, Sujatha, Lindley con sesgo de longitud, etc., son algunos casos particulares de la familia OPPE. La calidad de un lote se calcula en esta técnica, mediante el promedio del lote (μ) para la primera muestra y, para la segunda muestra, hemos tomado la media combinada para medir la calidad del lote. Además, hemos estimado el valor óptimo de los parámetros del plan propuesto mediante enfoques de optimización no lineal considerando el nivel de calidad aceptable y el nivel de calidad rechazable. Se da una parte comparativa del estudio, respecto al tamaño de la muestra, entre el plan de Muestreo Doble (DS) y el plan de Muestreo Único (SS) para la variable. Para describir el trabajo propuesto, también hemos tomado un ejemplo.
Referencias
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