MICROSCOPÍA ELECTRÓNICA DE TRANSMISIÓN Y MECÁNICA CUÁNTICA
QUANTUM MECHANICS AND THE ELECTRON MICROSCOPY
DOI:
https://doi.org/10.15446/mo.n59E.81623Keywords:
Microscopía electrónica de transmisión, holografía electrónica, interferencia electrónica, efecto ESAB. (es)Transmission electron microscopy, electron holography, electron interference, ESAB effect. (en)
Downloads
En este artículo se explica el proceso de creación del microscopio electrónico de transmisión y la técnica de microscopía electrónica. A su vez, se describen dos experimentos, el de interferencia de un solo electrón y el efecto Ahrenberg Siday-Aharonov-Bohm, los cuales evidencian aspectos del comportamiento de los electrones, que no podrían ser explicados desde la mecánica clásica y que se hacen evidentes gracias a este tipo de instrumentos y al uso de la holografía electrónica. Finalmente, se muestran algunos de los trabajos actuales en los que se utiliza la microscopía electrónica de transmisión en el grupo de microscopía electrónica del departamento de física.
In this article, the creation process of the Transmission electron microscope (TEM) is shown. Additionally, two experiments of a single electron interference and the ASAB (hrenberg Siday-Aharonov-Bohm)eect is described. This to evidence aspects of the electron behavior that couldn't be explained by the classical mechanics and result evident using TEM and electron holography. To nish some of the work done in the electron microscopy using TEM is presented.
References
M. M. Freundlich, Science (80-. ). 142, 185 (1963).
Karl F. Braun, in Nobel Lect. Phys. (World Scientic Publishing
Co., 1998), pp. 226{245.
E. Ruska, Angew. Chemie Int. Ed. English 26, 595 (1987).
M. Knoll and E. Ruska, Ann. Phys. 404, 607 (1932).
E. Hecht, Optica, Tercera (Addison Wesley, Espana, 2000).
E. Ruska, Z. Phys. 87, 580 (1934).
H. L. Watson, (n.d.).
T. P. Ryan, (2003).
Tim Palucka, Hist. Recent Sci. Technol. - Mater. Res. 1 (2002).
G. Mollenstedt, Phys. Status Solidi 116, 13 (1989).
G. Mollenstedt, in Adv. Opt. Electron Microsc. Vol. 12, edited
by T. Mulvey and C. J. R. Sheppard (Academic press, London,
U.K., 2013), p. 363.
D. Gabor, Nature 161, 777 (1948).
E. N. Leith and J. Upatnieks, J. Opt. Soc. Am. 52, 1123 (1962).
G. Mollenstedt and H. Duker, Naturwissenschaften 42, 41
(1955).
H. Lichte, J. Electron Microsc. (Tokyo). 47, 387 (1998).
H. Lichte and M. Lehmann, Rep. Prog. Phys. 71, 16102 (2008).
A. V. Crewe, D. N. Eggenberger, J. Wall, and L. M. Welter,
Rev. Sci. Instrum. 39, 576 (1968).
A. Tonomura, Proc. Jpn. Acad. Ser. B. Phys. Biol. Sci. 82, 45
(2006).
H. Lichte, Ultramicroscopy 20, 293 (1986).
A. Tonomura, ELECTRON HOLOGRAPHY.: 2nd Edition
(Springer, 1999).
H. Wahl, Bildebenenholographie Mit Elektronen, 1975.
Microscopía electrónica de transmisión y mecánica cuántica 23
J. W. S. del Sandino, Study of Solar Cells by Electron
Holography (2012).
O. Donati, G. P. Missiroli, and G. Pozzi, Am. J. Phys. 41, 639
(1973).
P. G. Merli, G. F. Missiroli, and G. Pozzi, Am. J. Phys. 44, 306
(1976).
G. F. Missiroli, G. Pozzi, and U. Valdre, J. Phys. E. 14, 649
(1981).
G. Mollenstedt and H. Duker, Zeitschrift Fur Phys. 145, 377
(1956).
R. Speidel and D. Kurz, Optik (Stuttg). 49, 173 (1977).
G. Mollenstedt and G. Wohland, in 7th Eur. Congr. Electron
Microsc. (Den Haag, 1980), p. 28.
A. Lubk, D. Wolf, and H. Lichte, Ultramicroscopy 110, 438
(2010).
S. Chung, D. J. Smith, and M. R. McCartney, Microsc.
Microanal. 13, 329 (2007).
T. M. Chou and M. Libera, Ultramicroscopy 94, 31 (2003).
R. M. Stern and A. Gervais, Surf. Sci. 17, 273 (1969).
E. Krimmel, G. Mollenstedt, and W. Rothemund, Appl. Phys.
Lett. 5, 209 (1964).
S. Yazdi, T. Kasama, M. Beleggia, M. Samaie Yekta, D. W.
McComb, A. C. Twitchett-Harrison, and R. E. Dunin-Borkowski,
Ultramicroscopy 152C, 10 (2014).
Dunin-Borkowski, T. Kasama, A.Wei, Steven Tripp, M. Hytch,
E. Snoek, R. Harrison, and A. Putnis, Microsc. Res. Tech. 64, 380
(2004).
H. Lichte, P. Formanek, A. Lenk, M. Linck, C. Matzeck, M.
Lehmann, and P. Simon, Annu. Rev. Mater. Res. 37, 539 (2007).
A. Tonomura, Proc. Jpn. Acad. Ser. B. Phys. Biol. Sci. 82, 45
(2006).
R. G. Chambers, Phys. Rev. Lett. 5, 3 (1960).
W. Bayh, Zeitschrift Fur Phys. 169, 492 (1962).
A. Tonomura, N. Osakabe, T. Matsuda, T. Kawasaki, J. Endo,
S. Yano, and H. Yamada, Phys. Rev. Lett. 56, 792 (1986).
N. Osakabe, T. Matsuda, T. Kawasaki, J. Endo, A. Tonomura,
S. Yano, and H. Yamada, Phys. Rev. A 34, 815 (1986).
John W. Sandino
R. P. Crease, Phys. World 15, 19 (2002).
Y. Aharonov and D. Bohm, PR 115, 485 (1959).
W. Ehrenberg and R. E. Siday, Proc. Phys. Soc. Sect. B 62, 8
(1949).
Y. Aharonov and D. Bohm, Phys. Rev. 125, 2192 (1962).
H. Boersch and B. Lischke, Zeitschrift Fur Phys. A Hadron.
Nucl. 237, 449 (1970).
How to Cite
APA
ACM
ACS
ABNT
Chicago
Harvard
IEEE
MLA
Turabian
Vancouver
Download Citation
License
Copyright (c) 2019 MOMENTO

This work is licensed under a Creative Commons Attribution-NoDerivatives 4.0 International License.
Those authors who have publications with this journal, accept the following terms:
a. The authors will retain their copyright and will guarantee the publication of the first publication of their work, which will be subject to the Attribution-SinDerivar 4.0 International Creative Commons Attribution License that permits redistribution, commercial or non-commercial, As long as the Work circulates intact and unchanged, where it indicates its author and its first publication in this magazine.
b. Authors are encouraged to disseminate their work through the Internet (eg in institutional telematic files or on their website) before and during the sending process, which can produce interesting exchanges and increase appointments of the published work.